EMC 2008 EMC 2008

EMC 2008

Vol 1: Instrumentation and Methods

Martina Luysberg und andere
    • 399,99 €
    • 399,99 €

Beschreibung des Verlags

Proceedings of the14th European Microscopy Congress, held in Aachen, Germany, 1-5 September 2008.

Jointly organised by the European Microscopy Society (EMS), the German Society for Electron Microscopy (DGE) and the local microscopists from RWTH Aachen University and the Research Centre Jülich, the congress brings together scientists from Europe and from all over the world.

The scientific programme covers all recent developments in the three major areas of instrumentation and methods, materials science and life science.

GENRE
Wissenschaft und Natur
ERSCHIENEN
2008
29. August
SPRACHE
EN
Englisch
UMFANG
900
Seiten
VERLAG
Springer Berlin Heidelberg
ANBIETERINFO
Springer Science & Business Media LLC
GRÖSSE
100
 MB
EMC 2008 EMC 2008
2008
Scanning Transmission Electron Microscopy Of Nanomaterials: Basics Of Imaging And Analysis Scanning Transmission Electron Microscopy Of Nanomaterials: Basics Of Imaging And Analysis
2014
IWNMS 2004 IWNMS 2004
2006
Modern Trends in Physics Research: Proceedings of the 4th International Conference on MTPR-10 Modern Trends in Physics Research: Proceedings of the 4th International Conference on MTPR-10
2013
Defect Recognition and Image Processing in Semiconductors 1997 Defect Recognition and Image Processing in Semiconductors 1997
2017
Introduction to X-Ray Powder Diffractometry Introduction to X-Ray Powder Diffractometry
2012