VLSI Design and Test VLSI Design and Test

VLSI Design and Test

21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers

Brajesh Kumar Kaushik und andere
    • 87,99 €
    • 87,99 €

Beschreibung des Verlags

This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017.
The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.

GENRE
Computer und Internet
ERSCHIENEN
2017
21. Dezember
SPRACHE
EN
Englisch
UMFANG
836
Seiten
VERLAG
Springer Nature Singapore
ANBIETERINFO
Springer Science & Business Media LLC
GRÖSSE
18,9
 MB

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