VLSI Design and Test VLSI Design and Test

VLSI Design and Test

23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers

Anirban Sengupta et autres
    • 92,99 €
    • 92,99 €

Description de l’éditeur

This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019.

The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.

GENRE
Informatique et Internet
SORTIE
2019
17 août
LANGUE
EN
Anglais
LONGUEUR
791
Pages
ÉDITIONS
Springer Nature Singapore
DÉTAILS DU FOURNISSEUR
Springer Science & Business Media LLC
TAILLE
99,8
Mo

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