Kelvin Probe Force Microscopy Kelvin Probe Force Microscopy

Kelvin Probe Force Microscopy

Measuring and Compensating Electrostatic Forces

    • 119,99 €
    • 119,99 €

Publisher Description

In the nearly 20 years of Kelvin probe force microscopy an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.

GENRE
Professional & Technical
RELEASED
2011
22 October
LANGUAGE
EN
English
LENGTH
348
Pages
PUBLISHER
Springer Berlin Heidelberg
SIZE
11.2
MB

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