Scanning Probe Microscopy Scanning Probe Microscopy
NanoScience and Technology

Scanning Probe Microscopy

Atomic Scale Engineering by Forces and Currents

    • USD 119.99
    • USD 119.99

Descripción editorial

Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in the style of a textbook, it explains from scratch the theory behind today’s simulation techniques and gives examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations used in today’s research, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the instrument's operation is changed by materials properties; theorists will understand how simulations can be directly compared to experimental data.

GÉNERO
Técnicos y profesionales
PUBLICADO
2006
14 de octubre
IDIOMA
EN
Inglés
EXTENSIÓN
296
Páginas
EDITORIAL
Springer New York
VENDEDOR
Springer Nature B.V.
TAMAÑO
11.6
MB
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