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Giulio is an expert in reliability of electronics and semiconductor devices, and electron microbeam spectrochemical analysis and electron diffraction. Giulio’s career began as a research physicist at the Naval Applied Science Laboratory (1963-1970) where he published papers in ultrasonics and electron microprobe analysis, and was issued two patents in those fields. In 1970 he joined IBM and retired in 2002 as a Senior Technical Staff Member and he contributed to major technologies such as Field Effect Transistors, Thermal Conduction Modules, and mathematical reliability models addressing failure mechanisms. Giulio also published 55 technical papers in science and technology journals, and was issued 24 patents in these development endeavors. He received Division and Outstanding awards during his career with IBM.