Ion Beams for Materials Analysis (Enhanced Edition) Ion Beams for Materials Analysis (Enhanced Edition)

Ion Beams for Materials Analysis (Enhanced Edition‪)‬

    • 74,99 €
    • 74,99 €

Descrizione dell’editore

The use of ion beams for materials analysis involves many different ion-atom interaction processes which previously have largely been considered in separate reviews and texts. A list of books and conference proceedings is given in Table 2. This book is divided into three parts, the first which treats all ion beam techniques and their applications in such diverse fields as materials science, thin film and semiconductor technology, surface science, geology, biology, medicine, environmental science, archaeology and so on.

GENERE
Professionali e tecnici
PUBBLICATO
1989
28 novembre
LINGUA
EN
Inglese
PAGINE
719
EDITORE
Elsevier Science
DIMENSIONE
17
MB

Altri libri di R. Curtis Bird & J. S. Williams