Advances in Speckle Metrology and Related Techniques Advances in Speckle Metrology and Related Techniques

Advances in Speckle Metrology and Related Techniques

    • ¥19,800
    • ¥19,800

発行者による作品情報

Speckle metrology includes various optical techniques that are based on the speckle fields generated by reflection from a rough surface or by transmission through a rough diffuser. These techniques have proven to be very useful in testing different materials in a non-destructive way. They have changed dramatically during the last years due to the development of modern optical components, with faster and more powerful digital computers, and novel data processing approaches.

This most up-to-date overview of the topic describes new techniques developed in the field of speckle metrology over the last decade, as well as applications to experimental mechanics, material science, optical testing, and fringe analysis.

ジャンル
科学/自然
発売日
2011年
1月25日
言語
EN
英語
ページ数
327
ページ
発行者
Wiley
販売元
John Wiley & Sons, Inc.
サイズ
14.5
MB
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