Microscopy of Semiconducting Materials
1999 Proceedings of the Institute of Physics Conference held 22-25 March 1999, University of Oxford, UK
-
- ¥74,800
-
- ¥74,800
発行者による作品情報
With IC technology continuing to advance, the analysis of very small structures remains critically important. Microscopy of Semiconducting Materials provides an overview of advances in semiconductor studies using microscopy. The book explores the use of transmission and scanning electron microscopy, ultrafine electron probes, and EELS to investigat
ジャンル
科学／自然
発売日
2000年
1月1日
言語
EN
英語
ページ数
774
ページ
発行者
CRC Press
販売元
Taylor & Francis Group
サイズ
80.4
MB
Microscopy of Semiconducting Materials 1983, Third Oxford Conference on Microscopy of Semiconducting Materials, St Catherines College, March 1983
2020年
Microscopy of Semiconducting Materials 1987, Proceedings of the Institute of Physics Conference, Oxford University, April 1987
2021年
Microscopy of Semiconducting Materials 2003
2018年
Microscopy of Semiconducting Materials 2001
2018年