Lock-in Thermography
Otwin Breitenstein, Wilhelm Warta & Martin Langenkamp
Silicon Optoelectronic Integrated Circuits
Horst Zimmermann
High Dielectric Constant Materials
Howard Huff & David Gilmer
System-level Test and Validation of Hardware/Software Systems
Matteo Sonza Reorda, Zebo Peng & Massimo Violante
Gettering Defects in Semiconductors
Victor A. Perevostchikov & Vladimir D. Skoupov
Low Power VCO Design in CMOS
Marc Tiebout
Continuous-Time Sigma-Delta A/D Conversion
Friedel Gerfers & Maurits Ortmanns
Detection and Signal Processing
Wilhelmus Jacobus Witteman
Highly Sensitive Optical Receivers
Kerstin Schneider
Bonding in Microsystem Technology
Jan A. Dziuban