Applied Scanning Probe Methods XII
Characterization
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- USD 189.99
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- USD 189.99
Descripción editorial
This volume examines the physical and technical foundation for progress in applied scanning probe techniques. It first introduces scanning probe microscopy, including sensor technology and tip characterization, and then details various industrial applications.
GÉNERO
Técnicos y profesionales
PUBLICADO
2008
24 de octubre
IDIOMA
EN
Inglés
EXTENSIÓN
279
Páginas
EDITORIAL
Springer Berlin Heidelberg
VENTAS
Springer Nature B.V.
TAMAÑO
12
MB
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