Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits More Books by Manoj Sachdev & José Pineda de Gyvez

Thermal and Power Management of Integrated Circuits Thermal and Power Management of Integrated Circuits
Thermal and Power Management of Integrated Circuits
2006
ESD Protection Device and Circuit Design for Advanced CMOS Technologies ESD Protection Device and Circuit Design for Advanced CMOS Technologies
ESD Protection Device and Circuit Design for Advanced CMOS Technologies
2008
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
2008