Microscopy of Semiconducting Materials
1999 Proceedings of the Institute of Physics Conference held 22-25 March 1999, University of Oxford, UK
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- USD 699.99
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- USD 699.99
Descripción editorial
With IC technology continuing to advance, the analysis of very small structures remains critically important. Microscopy of Semiconducting Materials provides an overview of advances in semiconductor studies using microscopy. The book explores the use of transmission and scanning electron microscopy, ultrafine electron probes, and EELS to investigat
GÉNERO
Ciencia y naturaleza
PUBLICADO
2000
1 de enero
IDIOMA
EN
Inglés
EXTENSIÓN
774
Páginas
EDITORIAL
CRC Press
VENDEDOR
Taylor & Francis Group
TAMAÑO
80.4
MB
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