Spectroscopic Ellipsometry for Photovoltaics Spectroscopic Ellipsometry for Photovoltaics
Springer Series in Optical Sciences

Spectroscopic Ellipsometry for Photovoltaics

Volume 1: Fundamental Principles and Solar Cell Characterization

    • USD 299.99
    • USD 299.99

Descripción editorial

This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid perovskites), fulfilling a critical need in the photovoltaic community.

The book describes optical constants of a variety of semiconductor light absorbers, transparent conductive oxides and metals that are vital for the interpretation of solar cell characteristics and device simulations. It is divided into four parts: fundamental principles of ellipsometry; characterization of solar cell materials/structures; ellipsometry applications including optical simulations of solar cell devices and online monitoring of film processing; and the optical constants of solar cell component layers.

GÉNERO
Ciencia y naturaleza
PUBLICADO
2019
10 de enero
IDIOMA
EN
Inglés
EXTENSIÓN
614
Páginas
EDITORIAL
Springer International Publishing
VENDEDOR
Springer Nature B.V.
TAMAÑO
62.7
MB
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