• $109.99

Publisher Description

Ellipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. In conjunction with the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices and fabrication advances, the ellipsometric analysis of their optical and material properties has progressed rapidly in the recent years.

GENRE
Science & Nature
RELEASED
2013
October 24
LANGUAGE
EN
English
LENGTH
384
Pages
PUBLISHER
Springer Berlin Heidelberg
SELLER
Springer Nature B.V.
SIZE
7
MB

More Books by Karsten Hinrichs & Klaus-Jochen Eichhorn