Low Voltage Electron Microscopy Low Voltage Electron Microscopy
RMS - Royal Microscopical Society

Low Voltage Electron Microscopy

Principles and Applications

    • ‏97٫99 US$
    • ‏97٫99 US$

وصف الناشر

Part of the Wiley-Royal Microscopical Society Series, this book discusses the rapidly developing cutting-edge field of low-voltage microscopy, a field that has only recently emerged due to the rapid developments in the electron optics design and image processing.

It serves as a guide for current and new microscopists and materials scientists who are active in the field of nanotechnology, and presents applications in nanotechnology and research of surface-related phenomena, allowing researches to observe materials as never before.

النوع
علم وطبيعة
تاريخ النشر
٢٠١٢
٣٠ نوفمبر
اللغة
EN
الإنجليزية
عدد الصفحات
٢٢٤
الناشر
Wiley
البائع
John Wiley & Sons, Inc.
الحجم
١٤٫٤
‫م.ب.‬
Biological Low-Voltage Scanning Electron Microscopy Biological Low-Voltage Scanning Electron Microscopy
٢٠٠٧
Scanning Transmission Electron Microscopy Of Nanomaterials: Basics Of Imaging And Analysis Scanning Transmission Electron Microscopy Of Nanomaterials: Basics Of Imaging And Analysis
٢٠١٤
Quantitative Microbeam Analysis Quantitative Microbeam Analysis
٢٠١٧
EMC 2008 EMC 2008
٢٠٠٨
Handbook of Infrared Detection Technologies Handbook of Infrared Detection Technologies
٢٠٠٢
Chemical Imaging Analysis Chemical Imaging Analysis
٢٠١٥
Constructing Social Theory Constructing Social Theory
٢٠٠٨
Social Dynamics of HIV Transmission Social Dynamics of HIV Transmission
٢٠٢٠
Diagnostic Electron Microscopy Diagnostic Electron Microscopy
٢٠١٢
Correlative Imaging Correlative Imaging
٢٠١٩
Understanding Light Microscopy Understanding Light Microscopy
٢٠١٩
Biological Field Emission Scanning Electron Microscopy Biological Field Emission Scanning Electron Microscopy
٢٠١٩
Standard and Super-Resolution Bioimaging Data Analysis Standard and Super-Resolution Bioimaging Data Analysis
٢٠١٧
Electron Beam-Specimen Interactions and Simulation Methods in Microscopy Electron Beam-Specimen Interactions and Simulation Methods in Microscopy
٢٠١٨