Scanning Transmission Electron Microscopy Of Nanomaterials: Basics Of Imaging And Analysis

The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.Contents:

 

Introduction (N Tanaka)
Historical Survey of the Development of STEM Instruments (N Tanaka)

Basic Knowledge of STEM:

Basics of STEM (N Tanaka and K Saitoh)
Application of STEM to Nanomaterials and Biological Specimens (N Shibata, S D Findlay, Y Ikuhara and N Tanaka)

Theories of STEM Imaging:

Theory for HAADF-STEM and Its Image Simulation (K Watanabe)
Theory for Annular Bright Field STEM Imaging (S D Findlay, N Shibata and Y Ikuhara)
Electron Energy-Loss Spectroscopy in STEM and Its Imaging (K Kimoto)
Density Functional Theory for ELNES in STEM-EELS (T Mizoguchi)

Advanced Methods in STEM:

Aberration Correction in STEM (H Sawada)
Secondary Electron Microscopy in STEM (H Inada and Y Zhu)
Scanning Confocal Electron Microscopy (K Mitsuishi and M Takeguchi)
Electron Tomography in STEM (N Tanaka)
Electron Holography and Lorentz Electron Microscopy in STEM (N Tanaka)
Recent Topics and Future Prospects in STEM (N Tanaka)
Readership: Graduate students and researchers in the field of nanomaterials and nanostructures.Key Features:


Most advanced; befitting beginning graduate students
Very convenient for advanced researchers who would like to use STEM and have a comprehensive understanding of the theory of image contrast and application details
Spans from the basic theory to the applications of STEM