Structural, Syntactic, and Statistical Pattern Recognition Structural, Syntactic, and Statistical Pattern Recognition

Structural, Syntactic, and Statistical Pattern Recognition

Joint IAPR International Workshops, S+SSPR 2020, Padua, Italy, January 21–22, 2021, Proceedings

Andrea Torsello and Others
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Publisher Description

This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2020, held in Padua, Italy, in January 2021.

The 35 papers presented in this volume were carefully reviewed and selected from 81 submissions.

The accepted papers cover the major topics of current interest in pattern recognition, including classification and clustering, deep learning, structural matching and graph-theoretic methods, and multimedia analysis and understanding.

GENRE
Computers & Internet
RELEASED
2021
April 9
LANGUAGE
EN
English
LENGTH
390
Pages
PUBLISHER
Springer International Publishing
SELLER
Springer Nature B.V.
SIZE
47.4
MB

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