VLSI Design and Test VLSI Design and Test

VLSI Design and Test

22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers

S. Rajaram and Others
    • $84.99
    • $84.99

Publisher Description

This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018.
The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces.

GENRE
Computers & Internet
RELEASED
2019
January 24
LANGUAGE
EN
English
LENGTH
740
Pages
PUBLISHER
Springer Nature Singapore
SELLER
Springer Nature B.V.
SIZE
108.8
MB

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