VLSI Design and Test VLSI Design and Test

VLSI Design and Test

23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers

Anirban Sengupta и другие
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    • 89,99 $

От издателя

This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019.

The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.

ЖАНР
Компьютеры и Интернет
РЕЛИЗ
2019
17 августа
ЯЗЫК
EN
английский
ОБЪЕМ
791
стр.
ИЗДАТЕЛЬ
Springer Nature Singapore
ПРОДАВЕЦ
Springer Nature B.V.
РАЗМЕР
99,8
МБ

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