VLSI Design and Test VLSI Design and Test

VLSI Design and Test

23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers

Anirban Sengupta và các tác giả khác
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    • 89,99 US$

Lời Giới Thiệu Của Nhà Xuất Bản

This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019.

The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.

THỂ LOẠI
Máy Vi Tính & Internet
ĐÃ PHÁT HÀNH
2019
17 tháng 8
NGÔN NGỮ
EN
Tiếng Anh
ĐỘ DÀI
791
Trang
NHÀ XUẤT BẢN
Springer Nature Singapore
NGƯỜI BÁN
Springer Nature B.V.
KÍCH THƯỚC
99,8
Mb

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