VLSI Design and Test VLSI Design and Test

VLSI Design and Test

23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers

Anirban Sengupta والمزيد
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وصف الناشر

This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019.

The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.

النوع
كمبيوتر وإنترنت
تاريخ النشر
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١٧ أغسطس
اللغة
EN
الإنجليزية
عدد الصفحات
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الناشر
Springer Nature Singapore
البائع
Springer Nature B.V.
الحجم
٩٩٫٨
‫م.ب.‬

المزيد من الكتب المشابهة

VLSI Design and Test VLSI Design and Test
VLSI Design and Test
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VLSI Design and Test VLSI Design and Test
VLSI Design and Test
٢٠١٩
VLSI Design and Test VLSI Design and Test
VLSI Design and Test
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VLSI-SoC: Technology Advancement on SoC Design VLSI-SoC: Technology Advancement on SoC Design
VLSI-SoC: Technology Advancement on SoC Design
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Microelectronic Devices, Circuits and Systems Microelectronic Devices, Circuits and Systems
Microelectronic Devices, Circuits and Systems
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VLSI-SoC: New Technology Enabler VLSI-SoC: New Technology Enabler
VLSI-SoC: New Technology Enabler
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المزيد من كتب Anirban Sengupta, Sudeb Dasgupta, Virendra Singh, Rohit Sharma & Santosh Kumar Vishvakarma

So Far and During So Far and During
So Far and During
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