VLSI Design and Test VLSI Design and Test

VLSI Design and Test

21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers

Brajesh Kumar Kaushik والمزيد
    • ‏84٫99 US$
    • ‏84٫99 US$

وصف الناشر

This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017.
The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.

النوع
كمبيوتر وإنترنت
تاريخ النشر
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٢١ ديسمبر
اللغة
EN
الإنجليزية
عدد الصفحات
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الناشر
Springer Nature Singapore
البائع
Springer Nature B.V.
الحجم
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‫م.ب.‬
VLSI Design and Test VLSI Design and Test
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VLSI Design and Test VLSI Design and Test
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VLSI Design and Test VLSI Design and Test
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VLSI-SoC: New Technology Enabler VLSI-SoC: New Technology Enabler
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VLSI-SoC: Opportunities and Challenges Beyond the Internet of Things VLSI-SoC: Opportunities and Challenges Beyond the Internet of Things
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VLSI-SoC: Technology Advancement on SoC Design VLSI-SoC: Technology Advancement on SoC Design
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Spacer Engineered FinFET Architectures Spacer Engineered FinFET Architectures
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Next Generation Spin Torque Memories Next Generation Spin Torque Memories
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Biosensors Biosensors
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Recent Trends in Communication and Electronics Recent Trends in Communication and Electronics
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Introduction to Microelectronics to Nanoelectronics Introduction to Microelectronics to Nanoelectronics
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Through Silicon Vias Through Silicon Vias
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