VLSI Design and Test VLSI Design and Test

VLSI Design and Test

26th International Symposium, VDAT 2022, Jammu, India, July 17–19, 2022, Revised Selected Papers

Ambika Prasad Shah والمزيد
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وصف الناشر

This book constitutes the proceedings of the 26th International Symposium on VLSI Design and Test, VDAT 2022, which took place in Jammu, India, in July 2022.
The 32 regular papers and 16 short papers presented in this volume were carefully reviewed and selected from 220 submissions. They were organized in topical sections as follows: Devices and Technology; Sensors; Analog/Mixed Signal; Digital Design; Emerging Technologies and Memory; System Design.

النوع
كمبيوتر وإنترنت
تاريخ النشر
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١٦ ديسمبر
اللغة
EN
الإنجليزية
عدد الصفحات
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الناشر
Springer Nature Switzerland
البائع
Springer Nature B.V.
الحجم
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‫م.ب.‬
VLSI Design and Test VLSI Design and Test
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VLSI Design and Test VLSI Design and Test
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VLSI Design and Test VLSI Design and Test
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Microelectronic Devices, Circuits and Systems Microelectronic Devices, Circuits and Systems
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VLSI-SoC: Technology Advancement on SoC Design VLSI-SoC: Technology Advancement on SoC Design
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VLSI-SoC: New Technology Enabler VLSI-SoC: New Technology Enabler
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