VLSI Design and Test VLSI Design and Test

VLSI Design and Test

21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers

Brajesh Kumar Kaushik 및 다른 저자
    • US$84.99
    • US$84.99

출판사 설명

This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017.
The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.

장르
컴퓨터 및 인터넷
출시일
2017년
12월 21일
언어
EN
영어
길이
836
페이지
출판사
Springer Nature Singapore
판매자
Springer Nature B.V.
크기
18.9
MB

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