VLSI Design and Test VLSI Design and Test

VLSI Design and Test

26th International Symposium, VDAT 2022, Jammu, India, July 17–19, 2022, Revised Selected Papers

Ambika Prasad Shah 및 다른 저자
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출판사 설명

This book constitutes the proceedings of the 26th International Symposium on VLSI Design and Test, VDAT 2022, which took place in Jammu, India, in July 2022.
The 32 regular papers and 16 short papers presented in this volume were carefully reviewed and selected from 220 submissions. They were organized in topical sections as follows: Devices and Technology; Sensors; Analog/Mixed Signal; Digital Design; Emerging Technologies and Memory; System Design.

장르
컴퓨터 및 인터넷
출시일
2022년
12월 16일
언어
EN
영어
길이
614
페이지
출판사
Springer Nature Switzerland
판매자
Springer Nature B.V.
크기
130
MB

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