VLSI Design and Test VLSI Design and Test

VLSI Design and Test

23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers

Anirban Sengupta 및 다른 저자
    • US$89.99
    • US$89.99

출판사 설명

This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019.

The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.

장르
컴퓨터 및 인터넷
출시일
2019년
8월 17일
언어
EN
영어
길이
791
페이지
출판사
Springer Nature Singapore
판매자
Springer Nature B.V.
크기
99.8
MB

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