VLSI Design and Test VLSI Design and Test

VLSI Design and Test

22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers

S. Rajaram 및 다른 저자
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    • US$84.99

출판사 설명

This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018.
The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces.

장르
컴퓨터 및 인터넷
출시일
2019년
1월 24일
언어
EN
영어
길이
740
페이지
출판사
Springer Nature Singapore
판매자
Springer Nature B.V.
크기
108.8
MB

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